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Springer Series in Solid-State Sciences Ser.: X-Ray Multiple-Wave Diffraction : Theory and Application by Shih-Lin Chang (2010, Trade Paperback)

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X-Ray Multiple-Wave Diffraction by Shih-Lin Chang. Designed primarily as a reference for researchers in condensed matter, crystallography, materials science, and synchrotron-related topics, the book will also be useful as a textbook for graduate and senior-year undergraduate courses on special topics in x-ray diffraction.

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Product Identifiers

Publisher
Springer Berlin / Heidelberg
ISBN-10
3642059473
ISBN-13
9783642059476
eBay Product ID (ePID)
109006334

Product Key Features

Number of Pages
Xii, 436 Pages
Language
English
Publication Name
X-Ray Multiple-Wave Diffraction : Theory and Application
Subject
Physics / Optics & Light, Physics / Crystallography, Physics / Mathematical & Computational, Physics / Nuclear
Publication Year
2010
Type
Textbook
Author
Shih-Lin Chang
Subject Area
Science
Series
Springer Series in Solid-State Sciences Ser.
Format
Trade Paperback

Dimensions

Item Weight
24.3 Oz
Item Length
9.3 in
Item Width
6.1 in

Additional Product Features

Intended Audience
Scholarly & Professional
Dewey Edition
22
Series Volume Number
143
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
548/.83
Table Of Content
1. Introduction.- 2. Elements of X-Ray Physics and Crystallography.- 3. Diffraction Geometry.- 4. Experimental Techniques.- 5. Kinematical Theory of X-Ray Diffraction.- 6. Dynamical Theory of X-Ray Diffraction.- 7. Theoretical Approaches.- 8. Dynamical Diffraction Properties and Behaviors.- 9. Applications.- References.- Figure Acknowledgements.
Synopsis
X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two- or higher-dimensional structures, like 2-d and 3-d crystals and even quasi- crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in- volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X- ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure- ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver- sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction., X-ray multiple-wave diffraction, sometimes called multiple diffraction or N-beam diffraction, results from the scattering of X-rays from periodic two or higher-dimensional structures, like 2-d and 3-d crystals and even quasi crystals. The interaction of the X-rays with the periodic arrangement of atoms usually provides structural information about the scatterer. Unlike the usual Bragg reflection, the so-called two-wave diffraction, the multiply diffracted intensities are sensitive to the phases of the structure factors in volved. This gives X-ray multiple-wave diffraction the chance to solve the X-ray phase problem. On the other hand, the condition for generating an X ray multiple-wave diffraction is much more strict than in two-wave cases. This makes X-ray multiple-wave diffraction a useful technique for precise measure ments of crystal lattice constants and the wavelength of radiation sources. Recent progress in the application of this particular diffraction technique to surfaces, thin films, and less ordered systems has demonstrated the diver sity and practicability of the technique for structural research in condensed matter physics, materials sciences, crystallography, and X-ray optics. The first book on this subject, Multiple Diffraction of X-Rays in Crystals, was published in 1984, and intended to give a contemporary review on the fundamental and application aspects of this diffraction.
LC Classification Number
QD901-999

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Springer Series in Solid-State Sciences Ser.: X-Ray Multiple-Wave Diffraction : Theory and Application by Shih-Lin Chang (2010, Trade Paperback)

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