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Caracterización de materiales ferroeléctricos a granel y películas delgadas por Markys G. Cai-
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N.º de artículo de eBay:395161404395
Última actualización el 22 sep 2024 15:35:19 H.EspVer todas las actualizacionesVer todas las actualizaciones
Características del artículo
- Estado
- ISBN-13
- 9789401777308
- Type
- NA
- Publication Name
- NA
- ISBN
- 9789401777308
- Book Title
- Characterisation of Ferroelectric Bulk Materials and Thin Films
- Book Series
- Springer Series in Measurement Science and Technology Ser.
- Publisher
- Springer Netherlands
- Item Length
- 9.3 in
- Publication Year
- 2016
- Format
- Trade Paperback
- Language
- English
- Illustrator
- Yes
- Genre
- Technology & Engineering, Science
- Topic
- Measurement, Materials Science / General, Physics / Crystallography, Materials Science / Thin Films, Surfaces & Interfaces
- Item Weight
- 157.1 Oz
- Item Width
- 6.1 in
- Number of Pages
- X, 280 Pages
Acerca de este producto
Product Identifiers
Publisher
Springer Netherlands
ISBN-10
9401777306
ISBN-13
9789401777308
eBay Product ID (ePID)
240100966
Product Key Features
Book Title
Characterisation of Ferroelectric Bulk Materials and Thin Films
Number of Pages
X, 280 Pages
Language
English
Publication Year
2016
Topic
Measurement, Materials Science / General, Physics / Crystallography, Materials Science / Thin Films, Surfaces & Interfaces
Illustrator
Yes
Genre
Technology & Engineering, Science
Book Series
Springer Series in Measurement Science and Technology Ser.
Format
Trade Paperback
Dimensions
Item Weight
157.1 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Series Volume Number
2
Number of Volumes
1 vol.
Table Of Content
Electrical Measurement of Ferroelectric Properties.- Piezoelectric Resonance.- Direct Piezoelectric Measurement - The Berlincourt Method.- Characterisation of Pyroelectric Materials.- Interferometry for Piezoelectric Materials and Thin Films.- Temperature Dependence of Ferroelectric and Piezoelectric Properties of PZT Ceramics.- Measurement and Modelling of Self-Heating in Piezoelectric Materials and Devices.- Piezoresponse Force Microscopy.- Indentation Stiffness Analysis of Ferroelectric Thin Films.- Losses in Piezoelectrics via Complex Resonance Analysis.- Dielectric Breakdown in Dielectrics and Ferroelectric Ceramics.- Standards for Piezoelectric and Ferroelectric Ceramics.
Synopsis
This book presents a comprehensive review of the most important methods used in the characterisation of piezoelectric, ferroelectric and pyroelectric materials. It covers techniques for the analysis of bulk materials and thick and thin film materials and devices. There is a growing demand by industry to adapt and integrate piezoelectric materials into ever smaller devices and structures. Such applications development requires the joint development of reliable, robust, accurate and - most importantly - relevant and applicable measurement and characterisation methods and models. In the past few years there has been a rapid development of new techniques to model and measure the variety of properties that are deemed important for applications development engineers and scientists. The book has been written by the leaders in the field and many chapters represent established measurement best practice, with a strong emphasis on application of the methods via worked examples and detailed experimental procedural descriptions. Each chapter contains numerous diagrams, images, and measurement data, all of which are fully referenced and indexed. The book is intended to occupy space in the research or technical lab, and will be a valuable and practical resource for students, materials scientists, engineers, and lab technicians., Electrical Measurement of Ferroelectric Properties.- Piezoelectric Resonance.- Direct Piezoelectric Measurement - The Berlincourt Method.- Characterisation of Pyroelectric Materials.- Interferometry for Piezoelectric Materials and Thin Films.- Temperature Dependence of Ferroelectric and Piezoelectric Properties of PZT Ceramics.- Measurement and Modelling of Self-Heating in Piezoelectric Materials and Devices.- Piezoresponse Force Microscopy.- Indentation Stiffness Analysis of Ferroelectric Thin Films.- Losses in Piezoelectrics via Complex Resonance Analysis.- Dielectric Breakdown in Dielectrics and Ferroelectric Ceramics.- Standards for Piezoelectric and Ferroelectric Ceramics.
LC Classification Number
TA418.5-.84
Descripción del artículo del vendedor
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- l***c (227)- Votos emitidos por el comprador.Mes pasadoCompra verificadaBook came packaged well to avoid damage, in great condition. Not sure if the seller delayed shipping or if usps didn’t update the shipping, which is highly likely. Still received and we are happy with our purchase. I had trouble looking up tracking due to the company they used but seller found usps tracking and sent that over quickly. Sellers communication was excellent. Would buy from again. Item as described.
- t***n (2908)- Votos emitidos por el comprador.Mes pasadoCompra verificadaI don't give negatives; However, description was not correct; No price guide was included in this book.As you will see in book pic shown; title states price guide included, no price guide inside. Communication poor, description, no communication price guide missing from this book. Shipping time was weeks before it was even shipped. Blamed the shipping on warehouse. You own & operate a business; your warehouse is not up to standards you change who you do business with. It's your responsibility.
- -***6 (133)- Votos emitidos por el comprador.Últimos 6 mesesCompra verificadaItem arrived as described and adequately packaged. Ridiculously long shipping time. Seller posts incorrect tracking number and lists the item as shipped. Contacted seller for correct tracking, received a new tracking number with the warning that the number won’t be “live” until the item is shipped. Will you get your item? Yeah, probably. Count on it being delivered 2-3 weeks longer than expected.