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Pruebas ESD: de componentes a sistemas, tapa dura de Voldman, Steven H., Li...-
USD133,80
Aproximadamente120,19 EUR
Estado:
Como nuevo
Libro en perfecto estado y poco leído. La tapa no tiene desperfectos y si procede, con sobrecubierta para las tapas duras. Incluye todas las páginas sin arrugas ni roturas. El texto no está subrayado ni resaltado de forma alguna, y no hay anotaciones en los márgenes. Puede presentar marcas de identificación mínimas en la contraportada o las guardas. Muy poco usado. Consulta el anuncio del vendedor para obtener más información y la descripción de cualquier posible imperfección.
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Ubicado en: Jessup, Maryland, Estados Unidos
Entrega:
Entrega prevista entre el mié. 9 oct. y el mié. 16 oct. a 43230
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14 días para devoluciones. El comprador paga el envío de la devolución.
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N.º de artículo de eBay:354952444935
Última actualización el 11 ago 2024 16:12:45 H.EspVer todas las actualizacionesVer todas las actualizaciones
Características del artículo
- Estado
- Book Title
- ESD Testing : From Components to Systems
- ISBN
- 9780470511916
- Subject Area
- Technology & Engineering
- Publication Name
- Esd Testing : from Components to Systems
- Publisher
- Wiley & Sons, Incorporated, John
- Item Length
- 9.7 in
- Subject
- Electronics / Semiconductors, Electronics / Circuits / Integrated, Electronics / Circuits / General
- Publication Year
- 2016
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Height
- 0.8 in
- Item Weight
- 22.4 Oz
- Item Width
- 6.9 in
- Number of Pages
- 328 Pages
Acerca de este producto
Product Identifiers
Publisher
Wiley & Sons, Incorporated, John
ISBN-10
0470511915
ISBN-13
9780470511916
eBay Product ID (ePID)
228461311
Product Key Features
Number of Pages
328 Pages
Publication Name
Esd Testing : from Components to Systems
Language
English
Publication Year
2016
Subject
Electronics / Semiconductors, Electronics / Circuits / Integrated, Electronics / Circuits / General
Type
Textbook
Subject Area
Technology & Engineering
Format
Hardcover
Dimensions
Item Height
0.8 in
Item Weight
22.4 Oz
Item Length
9.7 in
Item Width
6.9 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2016-023736
Dewey Edition
23
Dewey Decimal
621.38154
Synopsis
With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors' series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work., Presenting information on electrostatic discharge (ESD) and the characterization of semiconductor devices, this book examines ESD physical models and discusses the test systems and testing and specifications of each model, including the RF ESD test systems and magnetic recording (MR) systems and latchup.
LC Classification Number
TK7870.285.V65 2016
Descripción del artículo del vendedor
Información de vendedor profesional
Expert Trading Limited
John Boyer
9220 Rumsey Rd
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21045-1956 Columbia, MD
United States
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- i***y (712)- Votos emitidos por el comprador.Últimos 6 mesesCompra verificada2 volumes of Pogo comic strips, new and in perfect condition. Price was good, but shipping cost ($30 for two books) seems like a lot for how long it took to get delivered (23 days from Illinois to Spain). Also, seller communication was not great. First two times I wrote, their response did not address question. Third response explained at length about the private courier service they use and how it should take 1-10 business days to deliver. Maybe they should consider a different courier service.
- o***l (313)- Votos emitidos por el comprador.Último añoCompra verificadaThe item was described to a Tee. Very good communication. Shipping was just a little slow. The box the set of books comes in was damaged (bent corners) due to packaging. Not a deal breaker because the grand kids will not store in that box; might be if it were to be given as a present. The three books in the box arrived in prefect shape. I WOULD purchase from greatbookprices1 again in the future. ThanksConstruction Site Board Books Set, Hardcover by Rinker, Sherri Duskey; Lichte... (#364394914625)
- r***_ (108)- Votos emitidos por el comprador.Mes pasadoCompra verificada*Same as the other review* Purchased two box sets from this seller with one being advertised as "like new" but was delivered as if it was actually new. Shipping time was a little slow, takes about 10 days to ship out and it takes a while to get through the system. But the packing was great and I'm still overall happy with my purchase.