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Applied Electron Microskopy-Angewandte Elektronenmikroskopie Ser.: Near Field Emission Scanning Electron Microscopy by Taryl L. Kirk (2010, Trade Paperback)
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Title:-Near Field Emission Scanning Electron Microscopy� (Applied Electron Microskopy - Angewandte Elektronenmikroskopie). Format:-Paperback / softback. Genre:-Science, Physics, Nonfiction.
- ¡Cómpralo ya!Near Field Emission Scanning Electron Microscopy (Appli - Paperback / softback N
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Product Identifiers
PublisherLogos Verlag Berlin
ISBN-103832525181
ISBN-139783832525187
eBay Product ID (ePID)230129718
Product Key Features
Number of Pages97 Pages
LanguageEnglish
Publication NameNear Field Emission Scanning Electron Microscopy
Publication Year2010
SubjectGeneral, Physics / General, Chemistry / General
TypeTextbook
AuthorTaryl L. Kirk
Subject AreaTechnology & Engineering, Science
SeriesApplied Electron Microskopy-Angewandte Elektronenmikroskopie Ser.
FormatTrade Paperback
Dimensions
Item Weight4.5 oz.
Item Length8.3 in
Item Width5.7 in
Additional Product Features
Intended AudienceCollege Audience
