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CMOS Test and Evaluation: A Physical Perspective by Manjul Bhushan: New
USD155,72
Aproximadamente134,11 EUR
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Ubicado en: Sparks, Nevada, Estados Unidos
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Entrega prevista entre el lun. 27 oct. y el vie. 31 oct. a 94104
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N.º de artículo de eBay:406118037488
Última actualización el 06 sep 2025 09:26:20 H.EspVer todas las actualizacionesVer todas las actualizaciones
Características del artículo
- Estado
- Book Title
- CMOS Test and Evaluation: A Physical Perspective
- Publication Date
- 2016-09-10
- Pages
- 424
- ISBN
- 9781493947027
Acerca de este producto
Product Identifiers
Publisher
Springer New York
ISBN-10
1493947028
ISBN-13
9781493947027
eBay Product ID (ePID)
240529709
Product Key Features
Number of Pages
Xiii, 424 Pages
Language
English
Publication Name
Cmos Test and Evaluation : a Physical Perspective
Publication Year
2016
Subject
Physics / Condensed Matter, Microprocessors, Electronics / Semiconductors, Electronics / Circuits / General, Electronics / General
Type
Textbook
Subject Area
Computers, Technology & Engineering, Science
Format
Trade Paperback
Dimensions
Item Height
0.9 in
Item Weight
233.3 Oz
Item Length
9.2 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Trade
Number of Volumes
1 vol.
Illustrated
Yes
Table Of Content
Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.
Synopsis
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range., Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.
LC Classification Number
TK7800-8360
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