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CMOS Test and Evaluation: A Physical Perspective by Manjul Bhushan: New

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Características del artículo

Estado
Nuevo: Libro nuevo, sin usar y sin leer, que está en perfecto estado; incluye todas las páginas sin ...
Book Title
CMOS Test and Evaluation: A Physical Perspective
Publication Date
2016-09-10
Pages
424
ISBN
9781493947027
Categoría

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Product Identifiers

Publisher
Springer New York
ISBN-10
1493947028
ISBN-13
9781493947027
eBay Product ID (ePID)
240529709

Product Key Features

Number of Pages
Xiii, 424 Pages
Language
English
Publication Name
Cmos Test and Evaluation : a Physical Perspective
Publication Year
2016
Subject
Physics / Condensed Matter, Microprocessors, Electronics / Semiconductors, Electronics / Circuits / General, Electronics / General
Type
Textbook
Subject Area
Computers, Technology & Engineering, Science
Author
Mark B. Ketchen, Manjul Bhushan
Format
Trade Paperback

Dimensions

Item Height
0.9 in
Item Weight
233.3 Oz
Item Length
9.2 in
Item Width
6.1 in

Additional Product Features

Intended Audience
Trade
Number of Volumes
1 vol.
Illustrated
Yes
Table Of Content
Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.
Synopsis
CMOS Test and Evaluation: A Physical Perspective is a single source for an integrated view of test and data analysis methodology for CMOS products, covering circuit sensitivities to MOSFET characteristics, impact of silicon technology process variability, applications of embedded test structures and sensors, product yield, and reliability over the lifetime of the product. This book also covers statistical data analysis and visualization techniques, test equipment and CMOS product specifications, and examines product behavior over its full voltage, temperature and frequency range., Introduction.- CMOS Circuit Basics.- CMOS Storage Elements and Synchronous Logic.- IDDQ and Power.- Embedded PVT Monitors.- Variability.- Product Chip Test and Characterization.- Reliability, Burn-In and Guardbands.- Data Analysis and Characterization.- CMOS Metrics and Model Evaluation.
LC Classification Number
TK7800-8360

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