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Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wile...
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Libro que se ha leído pero que está en buen estado. Daños mínimos en la tapa, incluidas rozaduras, pero sin roturas ni agujeros. Es posible que no incluya sobrecubierta para tapas duras. Tapa muy poco desgastada. La mayoría de las páginas están en buen estado con muy pocas arrugas o roturas. El texto subrayado a lápiz es prácticamente inexistente, no hay texto resaltado ni anotaciones en los márgenes. No faltan páginas. Consulta el anuncio del vendedor para obtener más información y la descripción de cualquier posible imperfección.
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Gratis USPS Media MailTM.
Ubicado en: Renton, Washington, Estados Unidos
Entrega:
Entrega prevista entre el mar. 22 jul. y el sáb. 26 jul. a 94104
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N.º de artículo de eBay:297086972809
Última actualización el 10 mar 2025 09:31:49 H.EspVer todas las actualizacionesVer todas las actualizaciones
Características del artículo
- Estado
- Release Year
- 1990
- Book Title
- Accelerated Testing: Statistical Models, Test Plans, and Data ...
- ISBN
- 9780471522775
Acerca de este producto
Product Identifiers
Publisher
Wiley & Sons, Incorporated, John
ISBN-10
0471522775
ISBN-13
9780471522775
eBay Product ID (ePID)
670975
Product Key Features
Number of Pages
616 Pages
Language
English
Publication Name
Accelerated Testing : Statistical Models, Test Plans, and Data Analyses
Publication Year
1990
Subject
Probability & Statistics / General
Type
Textbook
Subject Area
Mathematics
Series
Wiley Series in Probability and Statistics Ser.
Format
Hardcover
Dimensions
Item Height
1.1 in
Item Weight
29 Oz
Item Length
9.4 in
Item Width
6.4 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
89-024853
Dewey Edition
20
Series Volume Number
257
Illustrated
Yes
Dewey Decimal
620.0011
Table Of Content
Models for Life Tests with Constant Stress.Graphical Data Analysis.Complete Data and Least Squares Analyses.Censored Data and Maximum Likelihood Methods.Test Plans.Competing Failure Modes and Size Effect.Least-Squares Comparisons for Complete Data.Maximum Likelihood Comparisons for Censored and Other Data.Models and Data Analyses for Step and Varying Stress.Accelerated Degradation.Appendix.References.Index.
Synopsis
The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ". . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." -Dev G. Raheja, Quality and Reliability Engineering International ". . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." -Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source., The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists. ." . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." -Dev G. Raheja, Quality and Reliability Engineering International ." . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." -Journal of the Royal Statistical Society A benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.
LC Classification Number
QA276.N45 1990
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wjtbuys
95% de votos positivos•1,1 mil artículos vendidos
Registrado como vendedor particularPor tanto, no se aplican los derechos de los consumidores derivados de las leyes de protección de los consumidores de la UE. La Garantía al cliente de eBay sigue aplicando a la mayoría de compras. Más informaciónMás información
Votos de vendedor (320)
- o***6 (681)- Votos emitidos por el comprador.Últimos 6 mesesCompra verificadaThe pins were as described - in perfect condition. They were well packaged to survive the mail and were shipped immediately. The seller was also kind enough the change the shipping options for me. Thank you so much. I would purchase again.X2 Ironic Made In China Pin Sustainability Microsoft How Can We Collectable (#296319132214)
- y***a (19)- Votos emitidos por el comprador.Último añoCompra verificadaThis seller is great! The item ordered was described perfectly, sent quickly and packaged well.US Navy and International Code Flag Cards Device 5LL2 75 Cards Complete (#296523504881)
- 5***8 (933)- Votos emitidos por el comprador.Último añoCompra verificadaVery pretty bracelet, exactly as described. Outstanding packaging and fast delivery. 💯satisfied. Highly recommend this seller. Thank you.Alex And Ani Not The Number of Followers Harry Potter Bangle Bracelets Set KIDS (#296428778110)