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Advanced Scanning Electron Microscopy and X-Ray Microanalysis by David C....
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Libro en perfecto estado y poco leído. La tapa no tiene desperfectos y si procede, con sobrecubierta para las tapas duras. Incluye todas las páginas sin arrugas ni roturas. El texto no está subrayado ni resaltado de forma alguna, y no hay anotaciones en los márgenes. Puede presentar marcas de identificación mínimas en la contraportada o las guardas. Muy poco usado. Consulta el anuncio del vendedor para obtener más información y la descripción de cualquier posible imperfección.
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N.º de artículo de eBay:185918576844
Última actualización el 04 sep 2024 08:31:46 H.EspVer todas las actualizacionesVer todas las actualizaciones
Características del artículo
- Estado
- Level
- Advanced
- ISBN
- 9780306421402
Acerca de este producto
Product Identifiers
Publisher
Springer
ISBN-10
0306421402
ISBN-13
9780306421402
eBay Product ID (ePID)
116524
Product Key Features
Number of Pages
Xii, 454 Pages
Language
English
Publication Name
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Subject
Materials Science / General, Pathology, Electron Microscopes & Microscopy, Microscopes & Microscopy
Publication Year
1986
Type
Textbook
Subject Area
Technology & Engineering, Science, Medical
Format
Hardcover
Dimensions
Item Weight
66.3 Oz
Item Length
9.2 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
85-028261
Dewey Edition
19
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
502/.8/25
Table Of Content
1. Modeling Electron Beam-Specimen Interactions.- 2. SEM Microcharacterization of Semiconductors.- 3. Electron Channeling Contrast in the SEM.- 4. Magnetic Contrast in the SEM.- 5. Computer-Aided Imaging and Interpretation.- 6. Alternative Microanalytical Techniques.- 7. Specimen Coating.- 8. Advances in Specimen Preparation for Biological SEM.- 9. Cryomicroscopy.- References.
Synopsis
This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con- tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro- ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan- ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol- ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol- ume, including those on magnetic contrast and electron channeling con- trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel- opment of new topics, such as digital image processing, which by their nature became topics in the advanced course., This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
LC Classification Number
RB1-214
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- i***i (362)- Votos emitidos por el comprador.Mes pasadoCompra verificadaItem as described and shipped quickly. Thanks.
- s***8 (20684)- Votos emitidos por el comprador.Últimos 6 mesesCompra verificadaSuccessful transaction, prompt shipment, A++++
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