Dayton Audio Test System Version 2 provides measurement data for any loudspeaker system or audio transducer. This system allows audio engineers to save time when measuring drivers, entire systems, and crossover networks. The testing system measures the responses of speakers to derive the full set of Thiele/Small parameters. After the measurements are completed, the software produces a high-resolution graph that holds 30,000 data points. The software also has the ability to measure Wright parameters, including Kr, Xi, Xr, and Ki.